van de Goor, Ad.J.: search on Z-Library

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1

Assessing complexity of supply chains: evidence from wholesalers

de Leeuw, Sander, Grotenhuis, Ruud, van Goor, Ad R.

Journal:

International Journal of Operations & Production Management

Year:

2013

Language:

english

File:

PDF, 420 KB

english, 2013

2

Sound-localization performance of patients with single-sided deafness is not improved when listening with a bone-conduction device

Agterberg, Martijn J.H., Snik, Ad F.M., Van de Goor, Rens M.G., Hol, Myrthe K.S., Van Opstal, A. John

Journal:

Hearing Research

Year:

2018

Language:

english

File:

PDF, 628 KB

english, 2018

3

Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy

Said Hamdioui, Ad J. Van De Goor

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 131 KB

english, 2000

4

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Detecting faults in the peripheral circuits and an evaluation of SRAM tests

van de Goor, Ad.J., Hamdioui, S., Wadsworth, R.

Year:

2004

Language:

english

File:

PDF, 685 KB

english, 2004

5

[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Low-cost, customized and flexible SRAM MBIST engine

van de Goor, Ad, Jung, Christian, Hamdioui, Said, Gaydadjiev, Georgi

Year:

2010

Language:

english

File:

PDF, 343 KB

english, 2010

6

[IEEE Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (28-29 July 2003)] Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003 - A fault primitive based analysis of linked faults in RAMs

Al-Ars, Z., Hamdioui, S., van de Goor, Ad.J.

Year:

2003

Language:

english

File:

PDF, 374 KB

english, 2003

7

[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Towards a uniform notation for memory tests

van de Goor, Ad.J., Offerman, A., Schanstra, I.

Year:

1996

Language:

english

File:

PDF, 738 KB

english, 1996

8

[ACM Press the conference - Munich, Germany (1999..-..)] Proceedings of the conference on Design, automation and test in Europe - DATE '99 - Industrial evaluation of DRAM tests

van de Goor, Ad J., de Neef, J.

Year:

1999

Language:

english

File:

PDF, 187 KB

english, 1999

9

[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Industrial evaluation of DRAM SIMM tests

van de Goor, Ad.J., Paalvast, A.

Year:

2000

Language:

english

File:

PDF, 927 KB

english, 2000

10

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Testing static and dynamic faults in random access memories

Hamdioui, S., Al-Ars, Z., van de Goor, Ad.J.

Year:

2002

Language:

english

File:

PDF, 327 KB

english, 2002

11

[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - An Investigation on Capacitive Coupling in RAM Address Decoders

Hamdioui, Said, Al-Ars, Zaid, Gaydadjiev, Georgi N., van de Goor, Ad J.

Year:

2007

Language:

english

File:

PDF, 598 KB

english, 2007

12

[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Using a CISC microcontroller to test embedded memories

van de Goor, Ad, Hamdioui, Said, Gaydadjiev, Georgi

Year:

2010

Language:

english

File:

PDF, 308 KB

english, 2010

13

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Generic, orthogonal and low-cost March Element based memory BIST

van de Goor, Ad J., Hamdioui, Said, Kukner, Halil

Year:

2011

Language:

english

File:

PDF, 553 KB

english, 2011

14

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Memory testing with a RISC microcontroller

van de Goor, Ad, Gaydadjiev, Georgi, Hamdioui, Said

Year:

2010

Language:

english

File:

PDF, 246 KB

english, 2010

15

Memory Fault Modeling Trends: A Case Study

Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 147 KB

english, 2004

16

Fast multiplication in VLSI using wave pipelining techniques

Fabian Klass, Michael J. Flynn, Ad J. Van De Goor

Journal:

Journal of Signal Processing Systems

Year:

1994

Language:

english

File:

PDF, 1.16 MB

english, 1994

17

The Selection of Distribution Control Techniques

de Leeuw, Sander, van Goor, Ad R., Ploos van Amstel, Rien

Journal:

The International Journal of Logistics Management

Year:

1999

File:

PDF, 1.54 MB

1999

18

[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults

van de Goor, Ad J., Hamdioui, Said, Gaydadjiev, Georgi N., Al-Ars, Zaid

Year:

2009

Language:

english

File:

PDF, 331 KB

english, 2009

19

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Consequences of RAM bitline twisting for test coverage

Schanstra, I., van de Goor, Ad.J.

Year:

2003

Language:

english

File:

PDF, 240 KB

english, 2003

20

Effective march algorithms for testing single-order addressed memories

AD J. Van De Goor, Yervant Zorian

Journal:

Journal of Electronic Testing

Year:

1994

Language:

english

File:

PDF, 717 KB

english, 1994

21

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Approximating infinite dynamic behavior for DRAM cell defects

Al-Ars, Z., van de Goor, Ad.J.

Year:

2002

Language:

english

File:

PDF, 334 KB

english, 2002

22

Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests

Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers

Journal:

Journal of Electronic Testing

Year:

2003

Language:

english

File:

PDF, 119 KB

english, 2003

23

[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Athens, Greece (2011.04.6-2011.04.8)] 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Optimizing memory BIST Address Generator implementations

van de Goor, Ad J., Kukner, Halil, Hamdioui, Said

Year:

2011

Language:

english

File:

PDF, 516 KB

english, 2011

24

Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs

Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Sultan Al-Harbi

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2006

Language:

english

File:

PDF, 447 KB

english, 2006

25

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - MBIST architecture framework based on orthogonal constructs

van de Goor, Ad J., Hamdioui, Said

Year:

2010

Language:

english

File:

PDF, 564 KB

english, 2010

26

[IEEE Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (28-29 July 2003)] Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003 - Systematic memory test generation for DRAM defects causing two floating nodes

Al-Ars, Z., van de Goor, Ad.J.

Year:

2003

Language:

english

File:

PDF, 322 KB

english, 2003

27

[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Advanced embedded memory testing: Reducing the defect per million level at lower test cost

Hamdioui, Said, van de Goor, Ad J.

Year:

2010

Language:

english

File:

PDF, 291 KB

english, 2010

28

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Functional memory faults: a formal notation and a taxonomy

van de Goor, Ad.J., Al-Ars, Z.

Year:

2000

Language:

english

File:

PDF, 273 KB

english, 2000

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